Download PDF by B. K. Tanner (auth.), Charles S. Barrett, John V.: Advances in X-Ray Analysis: Volume 33

By B. K. Tanner (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Paul K. Predecki (eds.)

ISBN-10: 1461399963

ISBN-13: 9781461399964

ISBN-10: 146139998X

ISBN-13: 9781461399988

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Extra resources for Advances in X-Ray Analysis: Volume 33

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13. 14. 15. 16. 17. 18. 19. I. CHARACTERIZATION OF EPITAXIAL THIN FILMS BY X-RAY DIFFRACTION M. , 26, 175 (1978). H. DOlle and J. B. Cohen, "Determining Stress Analysis from Powder Diffraction Patterns", pg. 1453, in NBS Special Publication #567 (1980). Metals Handbook, 9th Edition, 2, 176 (1982). E. Kula and V. ) "Residual Stress and Stress Relaxation", pg. , 28, Plenum Press, New York (1982). B. Borie, C. J. Sparks and J. V. , 10, 691 (1962). P. Georgopoulos, J. B. Cohen and H. Herman, "Residual Stress Measurements of a Plasma Sprayed Coating System Using Synchrotron X-Radiation", Mat.

By this automated procedure, rocking-curves of a numerous grain population are rapidly obtained from which the important parameter, namely the average halfwidth, p, of all the grains, can be determined to an accuracy of a few minutes of arc. This high accuracy in angular halfwidth is made possible by a combination of low instrumental broadening « 1 min of arc) combined with small incremental rotations of the specimen «< 1 min of arc). Sampling a numerous grain population of 100-500 grains, this method sensitively and rapidly measures the microdeformation range of the individual grains through its rocking curve halfwidth.

Recovery Kinetics of Alloy 600 with Small Plastic Strain One of the most important aspects in correlating the properties of microdeformation and micro recovery to the corresponding properties of the macrostructure is the inhomogeneity of deformation which occurs at all deformation levels. It occurs because the grains which lie in or close to positions of maximum stress undergo a more severe deformation than those further removed. Conversely, upon annealing, they recover also at an earlier stage.

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Advances in X-Ray Analysis: Volume 33 by B. K. Tanner (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Paul K. Predecki (eds.)

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